Forces in Scanning Probe Methods

638 Pages·1995·21.062 MB·English

by  H. Rohrer (auth.), H. J. Güntherodt, D. Anselmetti, E. Meyer (eds.)

Forces in Scanning Probe Methods
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Series E: Applied Sciences· Vol. 286
Forces in Scanning Probe
Methods
edited by
H.-J. GOntherodt
Institute of Physics,
University of Basel,
Basel, Switzerland
D. Anselmetti
Ciba Geigy Ud.,
Central Research Services Physics, K-127 .1.50,
Basel, Switzerland
and
E. Meyer
Institute of Physics,
University of Basel,
Basel, Switzerland
Springer-Science+Business Media, B.V.
Proceedings of the NATO Advanced Study Institute on
Forces in Scanning Probe Methods
Schluchsee, Germany
March 7-18, 1994
A C.I.P. Catalogue record for this book is available from the Library of Congress
ISBN 978-94-010-4027-3 ISBN 978-94-011-0049-6 (eBook)
DOI 10.1007/978-94-011-0049-6
Printed an acid-free paper
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@ 1995 Springer Science+Business Media Dordrecht
Originally published by Kluwer Academic Publishers in 1995
Softcover reprint of the hardcover 1s t edition 1995
No part of the material protected by this copyright notice may be reproduced or
utilized in any form or by any means, electronic or mechanical, including photo
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This book contains the proceedings of a NATO Advanced Research Workshop held within the programme
of activities of the NATO Special Programme on Nanoscale Science as part of the activities of the NATO
Science Committee.
Other books previously published as a result of the activities of the Special Programme are:
NASTASI, M., PARKING, D.M. and GLEIlER, H. (eds.), Mechanical Properties and Deformation Behavior of
Materials Having Ultra-Fine Microstructures. (E233) 1993 ISBN 0-7923-2195-2
VU THIEN BINH, GARCIA, N. and DRANSFELD, K. (eds), Nanosources and Manipulation of Atoms under
High Fields and Temperatures: Applications. (E235) 1993 ISBN 0-7923-2266-5
LEBURTON, I.-P., PASCUAL, I. and SOTOMAYOR TORRES, C. (eds.), Phonons in Semiconductor Nanostruc
tures. (E236) 1993 ISBN 0-7923-2277-0
AVOURIS, P. (ed.), Atomic and Nanometer-Scale Modification of Materials: Fundamentals and Applica
tions. (E239) 1993 ISBN 0-7923-2334-3
BLOCHL, P. E., JOACIDM, C. and FISHER, A. 1. (eds.), Computations for the Nano-Scale. (E240) 1993 ISBN
0-7923-2360-2
POHL, D. W. and COURJON, D. (eds.), Near Field Optics. (E242) 1993
ISBN 0-7923-2394-7
SALEMINK, H. W. M. and PASHLEY, M. D. (eds.), Semiconductor Interfaces at the Sub-Nanometer Scale.
(E243) 1993 ISBN 0-7923-2397-1
BENSAHEL, D. C., CANHAM, L. T. and OSSICINI, S. (eds.), Optical Properties of Low Dimensional Silicon
Structures. (E244) 1993 ISBN 0-7923-2446-3
HERNANDO, A. (ed.), Nanomagnetism (E247) 1993. ISBN 0-7923-2485-4
LOCKWOOD, DJ. and PINCZUK, A. (eds.), Optical Phenomena in Semiconductor Structures of Reduced
Dimensions (E248) 1993. ISBN 0-7923-2512-5
GENTILI, M., GIOVANNELLA, C. and SELCI, S. (eds.), Nanolithography: A Borderland Between STM, EB,
IB, and X-Ray Lithographies (E264) 1994. ISBN 0-7923-2794-2
CONTENTS
Pref'ac:e ...•.................••.•.....••.••..••••••.•......••...•......•. xiii
Introduction to Scanning Probe Methods
The Nanometer Age: Challenge and Chance
H. Rohrer .........................•...............•..•....•••....•••.•..•• 1
Instrumentation
Scanning Probe Microscopy Instrumentation
o. Marti and J. Colchero .................••.....•••..••..•...••...•.••.. 15
Low Temperature Scanning Force Microscopy
H.J. Hug, A. Moser, O. Frits, B. Stiefel and I. Parashikov ..........•..•.. 35
Measuring Ultrafast Voltage Signals Using a Scanning Force Microscope
A.S. Hou, F. Ho and D.M. Bloom ..............•.......••...............• 63
Oscillating String as a Force Sensor in Scanning Force Microscopy
A. Stalder and U. Diing .....•.•••.•...•.....•••.•.•..••••.............••. 69
Electrostatically Actuated Silicon Micromachined Sensors for Scanning
Force Microscopy
N. Blanc, J. Brugger and N.F. De Rooij ..............•....•.....•••.....• 79
Effect of Overlayer Thickness on the Nanoindentation of SiO,/Si
C.F. Draper, D.M. Schiffer, R.J. Colton and S.M. Hues ................•. 85
Na nostethoscopy: aNew Mode of Operation of the Atomic Force Microscope
A. Keaton, J.F. Holzrichter, R. Balhorn and W. J. Siekhaus .....•.....••. 91
A Multi-Test Instrument Based on Scanning Probe Technologies
L. McDonell, M. Phelan and E.M. Cashell ...•........•................... 99
Hydrophobic Surf'ac:e Interactions Studied Using a Novel Force Microscope
S.P. Jarvis and J.B. Pethica ..........................................•.. 105
Imaging Loal Electric Forces in Organic Thin Films by Scanning Maxwell
Stress Microscopy
T. Inoue, M.J. Jeffery and H. Yokoyama ................................ 113
Simultaneous AFM and Local Conductivity Imaging
A. Kulik, C. Wiithrich , G. Gremaud and G.H.D. Briggs. . . . ... . . . . .. . ... 119
Micromechanical Heat Sensor: Observation of a Chemical Reaction,
Photon and Electrical Heat Pulses
J.K. Gimlewski, Ch. Gerber, E. Meyer and R.R. Schlittler ••............ 123
viii
Theory
Forces in Scanning Probe Microscopy
S. Ciraci •...••...••....••.....•.......•••...••....•••...•.....•.......•• 133
Controlled Motion of Xe Atom on Metal Surfaces
A. Buldum, S. Ciraci and ~.Erltoc; ....•......•....•....•.•...•.•.....•... 149
Van der Waals Forces and Probe Geometeries for Some Specific Scanning
Force Microscopy Studies
N. Garcia and,V.T. Binh ................................................ 157
Atomistic Theory of the Interaction between AFM Tips and Ionic Surfaces
A.L. ShIuger, A.L. RohI, D.H. Gay and R.T. Williams ..•...•...•......•. 169
Molecular Dynamics Simulation of Atomic-Scale Adhesion, Deformation,
Friction, and Modification of Diamond Surfaces
J.A. Harrison, S.B. Sinnott, C.T. White, D.W. Brenner
and R.J. Colton ..............................•......•...••.........•..• 175
Simulation of SFM Images of Adsorbed Coo and C10 Molecules
Ch. Girard, M. Devel, A. Dereux and Ch. Joachim ........•............• 183
Metallle A.dhesion
Atomic-Seale Metal Adhesion
U. Diris ................................................................ 191
Photons
Photons and Forces I: Light Generates Force
D.W. PohI ........•...........•.•........•..........................•... 235
Photons and Forces II: Forces Influence Light
D.W. PohI ............................•...............••..•............• 249
Friction
Interfacial Friction and Adhesion of Wetted Monolayers
J .-M. Georges, A. Tonck and D. Muuyer ............................... 263
Coherent Phonon Generation in the Process of Friction
K. Dransfeld and J .Li ................................................... 273
Friction Force Microscopy
E.Meyer, R. Lithi, L. Howald and H.-J. Gintherodt ..................... 285
Molecular Seale Study of Domain Boundaries and Frictional Stick-Slip
Motion on Lipid Bilayers
R.M.Overney, H. Tabno, M. Fujihiia, G. Overney, W. Paulus
and H. Ringsdorf .•••••••••.......•.•.•...•..........•...••........•...• 307
ix
Two-Dimensional Atomic-Scale Friction Observed with an AFM
S. Fujisawa, E. Kishi, Y. Sugawara and S. Morita ...•...•.•....•...••.•. 313
Normal and Lateral Forces in Friction Force Microscopy
M. Labardi, M. Allegrini, C. Ascoli, C. Frediani and M. Salerno .•....... 319
Nanotribology and Chemical Sensitivity on a Nanometer Scale
o.
J. Burger, M. Binggeli, R. Christoph, H.E. Hintermann and Marti .... 325
Lateral Force Measurements on Phase Separated Polymer Surfaces
M. Motomatau, W. Misutani, H.Y. Nie and H. Tokumoto ...•.....•.•.•• 331
Friction and Load on Well Defined Suna ces Studied by Atomic Force
Microscopy
D.F. Ogletree, J. Hu, X.D. Xiao, C. Morant, Q. Dai, R. Vollmer,
R. Carpick and M. Salmeron ...........................•.•...••..•..••.. 337
Friction on an Atomic Scale
o.
J.Colchero, Marti and J. Mlynek ..•...........•.........•.•..•..•..•. 345
N ano and Micromechanics
Nanomechanics: Atomic Resolution and Frictional Energy Dissipation in
Atomic Force Microscopy
J .B. Pethica and A.P. Sutton ...............•........................... 353
Nanotribology and ita Applications to Magnetic Storage Devices and MEMS
B. Bhushan .•.........••......•.......•...•..•••..•.•.•.•..••.•....•.... 367
Lifetime Criteria of Macro- and Microtribological Systems
z.
Rymula .............•.....•.....•...•.••..•...•.•.•.•••.....•....•.. 397
Mechanical Property Evaluations of Solid Surfaces as a Technological
Application of SPM
R. Kaneko, M. Igarashi, T. Miyamoto and E. Hamada ........•..•......• 405
Effects of Boundary Lubricants and Metallic Oxides in Steel-Steel
Tribological Junctions Studied with the Atomic Force Microscope
M.P. Everson, A.K. Gangopadhyay, R.C. Jaklevic, D. SchoU and
W. Shen .................................•........•....................• 425
Magnetic Storage and Magnetic Forces
High-Density Recording Technologies as an Application of SPM
R. Kaneko and M. Igarashi .........•.......•........•..............•..• 431
Applications of Magnetic Force Microscopy
P. Gritter ..............................•..•••.•.•.•.•...•......•......• 447
Magnetic Force Microscopy on Thin Film Magnetic Recording Media
x
S. Porthun, M. Riihrig and J.C. Lodder ........•...•.....••......••.••.. 471
Analysis of Vortices in Superconductors by Scanning Probe Microscopy
U. Hartmann and A.A. Golubov ...............••.••••••..••............ 477
Application.
Understanding Surface Chemical Processes in Environmental Contamination:
New ApplicatioDl for AFM
S.L.S. Stipp and C.M. Eggleston .....................•....••............ 483
Force Microscopy of Heavy Ion Irradiated Materials
J. Ackermann, N. Angert, S. Grafstrom, T. Hagen, M. Neitaert,
R. Neumann and C. Trautmann ......................................... 489
Atomic Force Microscopy as a Tool to Study Surface Roughnell Effect. In
X-Ray Photoelectron Spectroscopy
P.L.J. Gunter and J.W. Niemantsverdriet ....•......••......•........•.. 495
Atomic-Resolution Image of GaAa (110) Surface with an
Ultrahigh-Vacuum Atomic Force Microscope (UHV-AFM)
Y. Sugawara, M. Ohta, K. Hontani, S. Morita, F. Osaka, S. Ohkoucbi,
M. Suzuki, H. Nagaoka, S. Mishima and T. Okada .......•............... 501
Time dependence and its Spatial Distribution of Densely
Contact-Electrified Electrons on a Thin Silicon Oxide
Y. Sugawara, S. Morita, Y. Fukano, T. Uchibashi, T. OkUlUO,
A. Chayabara, Y. Yamanishi and T. Oua ........•....•.•.•.....•....... 507
Giant Atomic Corrugations on Layered Dichalcogenides Investigated by
AFM/LFM
Th. Schimmel, R. Kemnitaer, J. Kiippers, Ch. Kloc
and M. Lux-Steiner •......•.....••.••..........••...••........•...•...•. 513
Nanometer Scale Machining of Covalent Monolayers Investigated by
Combined AFM/ LFM
Th. Schimmel, R. Kemnitaer, J. Kiippers, Ch. Kloc
and M. Lux-Steiner ..............................•.•••••.•............•. 519
Atomic Resolution Imaging of ReS2 by AFM/LFM
Th. Schimmel, K. Friemelt, J. Kiippers and M. Lux-Steiner 525
Ultra-High-Vacuum Atomic Force Microscopy in the Study of Model
Catalysts
A. Partridge, S.L.G. Toulll&int, C.F.J Flipse and E.W. Kuipers ...•..••.. 531
AFM in Liquid.
AFM Observations ofSi (111) in Solutions
A. Ando, K. Mm, T. Shimizu, K. Matsumoto, Y. Morita and H. Tokumoto 537
xi
Atomic Scale Force Mapping with the Atomic Force Microscope
J.P. Cleveland, M. Radmacher and P.K. Hansma ...........•............ 543
Organics and Biology
Imaging Chemical Bonds by SPM
J .E. Frommer ........................................................... 551
Study of Thin Organic Films by Various Scanning Force Microscopes
M. Fujihira .•••.••••.••••.•••.•••.••..••••••••••.•••.•••.•••••.••.•••••• 567
Molecular Arrangement and Mechanical Stability of Self-Assembled
Monolayers on Au (111) under Applied Load
M. Salmeron, G.-Y. Liu and D.F. Ogletree .............................. 593
Organic Interl'ace Inspection by Scanning Force Microscopy
L.M. Eng .......................................•................•...... 599
Atomic Force Microscopy of Biological Membranes: Current PoBSibilities
and Prospects
F. Schabert and A. Engel .........................••...•........•..•.... 607
Biomolecule Photoimmobilisation: Application in Scanning Probe
Microscopy
R. Luginbiihl, A. Collioud, H. Siegenthaler and H. Sigrist .•.............. 615
Measuring Molecular Adhesion with Force Microscopy
U. Dammer, D. AnselmeUi, M. Hegner, L.M. Dreier, W. Huber, J. Hurst,
G. Misevic and H.-J.Giintherodt ........................................ 625
Author-index ........................................................... 633
Subject-index ........................................................... 637